IEEE Multi-conference on
Systems and Control

September 3-5, 2008

San Antonio, Texas (USA)

 

 

 

 

 

 

 

 

 

 

NEWS

 




National Science Foundation
The slides of the NSF presentations are available.


Plenary talks
Jean de Lafontaine
Jay Farrell
Kameshwar Poolla


The winner of 2008 Industry Award for Excellence in Translational Control Research is
Professor Lino Guzzella
Head of the Measurement and Control Laboratory (IMRT)
ETH, Zurich


The winner of the 2008 IEEE MSC Best Student Paper Award
is Carlos H. Caicedo-Nunez


2008 IEEE MSC Advance Program


Photo Albums (best viewed with MS Internet Explorer)
Album 1
Album 2

MSC 2008 Home
CCA2008
CACSD2008
ISIC2008

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Best Student Paper Award
Call for Late News Papers
Conference Support for Developing Nations
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The 2008 IEEE Multi-conference on Systems and Control (MSC), to be held at the Hilton Palacio del Rio in San Antonio, Texas, September 3-5, 2008, gathers up three of the major international conferences promoted by the IEEE Control Systems Society:

  • the IEEE International Conference on Control Applications (CCA) − initiated in 1992 − with the goal of bringing together experts from academy and industry from different countries to present new research results in control applications, promoting and encouraging industrial participation in the activities of the IEEE Control Systems Society;

  • the IEEE International Symposium on Computer-Aided Control System Design (CACSD) − initiated in 1992 − to be a place for discussion and promotion of the new developments of algorithms, software tools and interfaces to be used as enabling technologies in control engineering; 

  • the IEEE International Symposium on Intelligent Control (ISIC) initiated in 1985. It provides a unique opportunity for researchers and practitioners from different areas to discuss innovative control algorithms, also developed by emulating certain characteristics of intelligent biological systems, and recent advancements in computing technology, that may open avenues for significant technological advances.

The conference welcomes paper, session, tutorial and workshop submissions presenting new research results and perspectives on future developments, covering a broad range of topics relevant to control applications, methods and development tools.

The conference proceedings will be included in IEEE Xplore and indexed by INSPEC and Ei-Compendex.

 

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